Follow
Rahul Kande
Title
Cited by
Cited by
Year
TheHuzz: Instruction Fuzzing of Processors Using Golden-Reference Models for Finding Software-Exploitable Vulnerabilities
R Kande, A Crump, G Persyn, P Jauernig, AR Sadeghi, A Tyagi, ...
31st USENIX Security Symposium (USENIX Security 22), 3219-3236, 2022
47*2022
LLM-assisted Generation of Hardware Assertions
R Kande, H Pearce, B Tan, B Dolan-Gavitt, S Thakur, R Karri, J Rajendran
arXiv preprint arXiv:2306.14027, 2023
352023
HyPFuzz: Formal-Assisted Processor Fuzzing
C Chen, R Kande, N Nguyen, F Andersen, A Tyagi, AR Sadeghi, ...
32nd USENIX Security Symposium (USENIX Security 23), 2023
142023
Organizing The World's Largest Hardware Security Competition: Challenges, Opportunities, and Lessons Learned
AR Sadeghi, J Rajendran, R Kande
Proceedings of the 2021 on Great Lakes Symposium on VLSI, 95-100, 2021
132021
PSOFuzz: Fuzzing Processors with Particle Swarm Optimization
C Chen, V Gohil, R Kande, AR Sadeghi, J Rajendran
IEEE/ACM International Conference on Computer Aided Design (ICCAD), 1--9, 2023
62023
Trusting the Trust Anchor: Towards Detecting Cross-Layer Vulnerabilities with Hardware Fuzzing
C Chen, R Kande, P Mahmoody, AR Sadeghi, JV Rajendran
Proceedings of the 59th ACM/IEEE Design Automation Conference, 1379-1383, 2022
62022
(Security) Assertions by Large Language Models
R Kande, H Pearce, B Tan, B Dolan-Gavitt, S Thakur, R Karri, J Rajendran
IEEE Transactions on Information Forensics and Security, 2024
32024
WhisperFuzz: White-Box Fuzzing for Detecting and Locating Timing Vulnerabilities in Processors
P Borkar, C Chen, M Rostami, N Singh, R Kande, AR Sadeghi, C Rebeiro, ...
arXiv preprint arXiv:2402.03704, 2024
32024
MABFuzz: Multi-Armed Bandit Algorithms for Fuzzing Processors
V Gohil, R Kande, C Chen, AR Sadeghi, J Rajendran
arXiv preprint arXiv:2311.14594, 2023
32023
Beyond random inputs: A novel ML-based hardware fuzzing
M Rostami, M Chilese, S Zeitouni, R Kande, J Rajendran, AR Sadeghi
arXiv preprint arXiv:2404.06856, 2024
22024
LLMs for Hardware Security: Boon or Bane?
R Kande, V Gohil, M DeLorenzo, C Chen, J Rajendran
2024 IEEE 42nd VLSI Test Symposium (VTS), 1-4, 2024
2024
Fuzzerfly Effect: Hardware Fuzzing for Memory Safety
M Rostami, C Chen, R Kande, H Li, J Rajendran, AR Sadeghi
IEEE Security & Privacy, 2024
2024
The system can't perform the operation now. Try again later.
Articles 1–12