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Yanzhi WangNortheastern UniversityVerified email at northeastern.edu
Mengshu SunBeijing University of TechnologyVerified email at bjut.edu.cn
Hao TangMIT | Harvard University | CMU | ETHZ | University of Oxford | UoT | PKU | IIAIVerified email at andrew.cmu.edu
Xue LinNortheastern UniversityVerified email at northeastern.edu
Bin RenWilliam & Mary; Pacific Northwest National Laboratories; Ohio State UniversityVerified email at cs.wm.edu
Yanyue XiePhD Student, Northeastern UniversityVerified email at northeastern.edu
Minghai QinResearch Scientist, Western DigitalVerified email at wdc.com
Zhenman FangAssistant Professor, Simon Fraser UniversityVerified email at sfu.ca
Olivia ChenKyushu University, Department of Advanced Information Technology, Associate ProfessorVerified email at ait.kyushu-u.ac.jp
Weiwen JiangGeorge Mason UniversityVerified email at gmu.edu
Huazhong YangProfessor of Electronics Engineering, Tsinghua UniversityVerified email at tsinghua.edu.cn
Fei Qiao 乔飞Sense Lab, Dept. of Electronic Engineering, Tsinghua University, ChinaVerified email at tsinghua.edu.cn
Dingwen TaoIndiana University Bloomington, IEEE/ACM Senior MemberVerified email at iu.edu
Xulong TangUniversity of PittsburghVerified email at pitt.edu
Nobuyuki YoshikawaYokohama National UniveristyVerified email at ynu.ac.jp
Hayden Kwok-Hay SoUniveristy of Hong KongVerified email at eee.hku.hk
Tony (Tong) GengAssistant Professor, University of RochesterVerified email at rochester.edu
Martin HerbordtProfessor, Electrical and Computer Engineering, Boston UniversityVerified email at bu.edu
Yuan XieChair Professor of Hong Kong University of Science and Technology (HKUST)Verified email at ust.hk
Ang LiPacific Northwest National Laboratory and University of WashingtonVerified email at pnnl.gov