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Co-authors
- Juergen BruggerProfessor of Microengineering (EPFL)Verified email at epfl.ch
- Xin-Ping QuFudan universityVerified email at fudan.edu.cn
- Yifang ChenFudan UniversityVerified email at fudan.edu.cn
- Leo GrossIBM Research - ZurichVerified email at zurich.ibm.com
- Luis Guillermo VillanuevaÉcole Polytechnique Fédérale de Lausanne (EPFL)Verified email at epfl.ch
- Shaoren DengGhent UniversityVerified email at ugent.be
- Valentin FlauraudEPFL LausanneVerified email at photovf.com
- Yusuf LeblebiciProfessor of Electrical Engineering, EPFLVerified email at epfl.ch
- Giovanni De MicheliEPFL, StanfordVerified email at epfl.ch
- Haixia(Alice) ZhangPeking UniversityVerified email at pku.edu.cn
- W TangBeijing Institute of Nanoenergy and Nanosystems, Chinese Academy of Sciences, Beijing, ChinaVerified email at binn.cas.cn
- Loïc Jacot DescombesAdvanced Consultant, AltranVerified email at altran.com
- Alfred LudwigMaterials Discovery and Interfaces, Institute for Materials & ZGH & RC FEMS, Ruhr-Universität BochumVerified email at rub.de