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Mariane Comte
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A simulator of small-delay faults caused by resistive-open defects
A Czutro, N Houarche, P Engelke, I Polian, M Comte, M Renovell, ...
2008 13th European Test Symposium, 113-118, 2008
672008
Making predictive analog/RF alternate test strategy independent of training set size
H Ayari, F Azais, S Bernard, M Comte, V Kerzerho, O Potin, M Renovell
2012 IEEE International Test Conference, 1-9, 2012
512012
Smart selection of indirect parameters for DC-based alternate RF IC testing
H Ayari, F Azais, S Bernard, M Comte, M Renovell, V Kerzerho, O Potin, ...
2012 IEEE 30th VLSI Test Symposium (VTS), 19-24, 2012
462012
A new methodology for ADC test flow optimization
S Bernard, M Comte, F Azaïs, Y Bertrand, M Renovell
International Test Conference, 201-209, 2003
292003
Efficiency evaluation of analog/RF alternate test: Comparative study of indirect measurement selection strategies
S Larguech, F Azaïs, S Bernard, M Comte, V Kerzérho, M Renovell
Microelectronics Journal 46 (11), 1091-1102, 2015
232015
Securing color information of an image by concealing the color palette
M Chaumont, W Puech, C Lahanier
Journal of Systems and Software 86 (3), 809-825, 2013
222013
A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs
V Kerzerho, P Cauvet, S Bernard, F Azais, M Comte, M Renovell
IEEE Design & Test of Computers 23 (3), 234-243, 2006
212006
A novel DFT technique for testing complete sets of ADCs and DACs in complex SiPs
V Kerzerho, P Cauvet, S Bernard, F Azais, M Comte, M Renovell
IEEE Design & Test of Computers 23 (3), 234-243, 2006
212006
Use of ensemble methods for indirect test of RF circuits: can it bring benefits?
H El Badawi, F Azaïs, S Bernard, M Comte, V Kerzérho, F Lefevre
2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019
162019
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI--LVT and RVT Configurations
A Karel, M Comte, JM Galliere, F Azais, M Renovell
2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 164-169, 2016
162016
Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI--LVT and RVT Configurations
A Karel, M Comte, JM Galliere, F Azais, M Renovell
2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 164-169, 2016
162016
MIRID: Mixed-mode IR-drop induced delay simulator
J Jiang, M Aparicio, M Comte, F Azaïs, M Renovell, I Polian
2013 22nd Asian Test Symposium, 177-182, 2013
152013
A novel implementation of the histogram-based technique for measurement of INL of LUT-based correction of ADC
V Kerzérho, S Bernard, F Azaïs, M Comte, O Potin, C Shan, G Bontorin, ...
Microelectronics Journal 44 (9), 840-843, 2013
142013
" Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC
V Kerzerho, P Cauvet, S Bernard, F Azaïs, M Comte, M Renovell
Eleventh IEEE European Test Symposium (ETS'06), 159-164, 2006
142006
" Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC
V Kerzerho, P Cauvet, S Bernard, F Azaïs, M Comte, M Renovell
Eleventh IEEE European Test Symposium (ETS'06), 159-164, 2006
142006
Correlation between static and dynamic parameters of A-to-D converters: in the view of a unique test procedure
F Azaïs, S Bernard, Y Bertrand, M Comte, M Renovell
Journal of Electronic Testing 20 (4), 375-387, 2004
142004
Efficiency of spectral-based ADC test flows to detect static errors
S Bernard, M Comte, F Azaïs, Y Bertrand, M Renovell
Journal of Electronic Testing 20 (3), 257-267, 2004
132004
Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect
A Karel, M Comte, JM Galliere, F Azais, M Renovell
2016 17th Latin-American Test Symposium (LATS), 129-134, 2016
122016
A generic methodology for building efficient prediction models in the context of alternate testing
S Larguech, F Azaïs, S Bernard, M Comte, V Kerzerho, M Renovell
2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW), 1-6, 2015
122015
Resistive bridging defect detection in bulk, fdsoi and finfet technologies
A Karel, M Comte, JM Galliere, F Azais, M Renovell
Journal of Electronic Testing 33, 515-527, 2017
102017
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