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Co-authors
- Sunghyun Choi, Ph.D., FIEEEExecutive VP, Samsung ElectronicsVerified email at samsung.com
- Saewoong Bahk (박세웅)Seoul National University, Electrical and Computer EngineeringVerified email at snu.ac.kr
- Seongwon KimResearch Engineer @SK TelecomVerified email at mwnl.snu.ac.kr
- Tarik TalebRuhr University BochumVerified email at ieee.org
- Dongmyoung KimSK TelecomVerified email at sk.com
- Goodsol LeeSeoul National UniversityVerified email at netlab.snu.ac.kr
- Siyoung ChoiStandard Engineer, LG ElectronicsVerified email at lge.com
- Felipe Gómez-CubaBeatriz Galindo Distinguished Researcher, University of VigoVerified email at gts.uvigo.es
- Michele ZorziDept. of Information Engineering - University of Padova, ItalyVerified email at dei.unipd.it
- Michele PoleseNortheastern UniversityVerified email at northeastern.edu
- Taekyoung (Ted) KwonSeoul National UniversityVerified email at mmlab.snu.ac.kr
- Byonghyo ShimProfessor, Department of Electrical and Computer Engineering, Seoul National UniversityVerified email at snu.ac.kr
- Jaehong YiVerified email at mwnl.snu.ac.kr
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