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Antonio Rubio
Antonio Rubio
Professor of Electrical Engineering (UPC)
Verified email at upc.edu
Title
Cited by
Cited by
Year
Human powered piezoelectric batteries to supply power to wearable electronic devices
JL González, A Rubio, F Moll
International journal of the Society of Materials Engineering for Resources …, 2002
2232002
Analysis and solutions for switching noise coupling in mixed-signal ICs
X Aragones, JL Gonzalez, A Rubio
Springer Science & Business Media, 2013
1872013
An approach to the analysis and detection of crosstalk faults in digital VLSI circuits
A Rubio, N Itazaki, X Xu, K Kinoshita
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1994
1591994
Electrical model of the floating gate defect in CMOS ICs: implications on I/sub DDQ/testing
VH Champac, A Rubio, J Figueras
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1994
1281994
Current vs. logic testing of gate oxide short, floating gate and bridging failures in CMOS
R Rodríguez-Montañés, JA Segura, VH Champac, J Figueras, JA Rubio
1991, Proceedings. International Test Conference, 510, 1991
1281991
Dynamic surface temperature measurements in ICs
J Altet, W Claeys, S Dilhaire, A Rubio
Proceedings of the IEEE 94 (8), 1519-1533, 2006
962006
Thermal coupling in integrated circuits: application to thermal testing
J Altet, A Rubio, E Schaub, S Dilhaire, W Claeys
IEEE Journal of Solid-State Circuits 36 (1), 81-91, 2001
892001
Crossbar-based memristive logic-in-memory architecture
G Papandroulidakis, I Vourkas, A Abusleme, GC Sirakoulis, A Rubio
IEEE transactions on nanotechnology 16 (3), 491-501, 2017
812017
Experimental comparison of substrate noise coupling using different wafer types
X Aragones, A Rubio
IEEE Journal of Solid-State Circuits 34 (10), 1405-1409, 1999
711999
Quiescent current sensor circuits in digital VLSI CMOS testing
A Rubio, J Figueras, J Segura
Electronics Letters 26 (15), 1204-1206, 1990
691990
A prospect on the use of piezoelectric effect to supply power to wearable electronic devices
JL Gonzalez, A Rubio, F Moll
Fourth Int. Conf. Mater. Eng. Resources, ICMR, 202-206, 2001
662001
A detailed analysis of GOS defects in MOS transistors: testing implications at circuit level
J Segura, C De Benito, A Rubio, CF Hawkins
Proceedings of 1995 IEEE International Test Conference (ITC), 544-551, 1995
651995
Four different approaches for the measurement of IC surface temperature: application to thermal testing
J Altet, S Dilhaire, S Volz, JM Rampnoux, A Rubio, S Grauby, LDP Lopez, ...
Microelectronics journal 33 (9), 689-696, 2002
642002
Reliability challenges in design of memristive memories
P Pouyan, E Amat, A Rubio
2014 5th European Workshop on CMOS Variability (VARI), 1-6, 2014
602014
Fault Modelling of Gate Oxide Short, Floating Gate and Bridging Failuers in CMOS Circuit
VH Champac
Proc. of European Test Conf., 143-148, 1991
581991
Experimental study of artificial neural networks using a digital memristor simulator
V Ntinas, I Vourkas, A Abusleme, GC Sirakoulis, A Rubio
IEEE transactions on neural networks and learning systems 29 (10), 5098-5110, 2018
562018
An approach to crosstalk effect analysis and avoidance techniques in digital CMOS VLSI circuits
R Anglada, A Rubio
International Journal of Electronics 65 (1), 9-17, 1988
551988
Noise generation and coupling mechanisms in deep-submicron ICs
X Aragonès, JL González, F Moll, A Rubio
IEEE Design & Test of Computers 19 (5), 27-35, 2002
542002
Quiescent current analysis and experimentation of defective CMOS circuits
JA Segura, VH Champac, R Rodriguez-Montanes, J Figueras, JA Rubio
Journal of Electronic Testing 3, 337-348, 1992
541992
Thermal testing of integrated circuits
J Altet, A Rubio
Springer Science & Business Media, 2002
522002
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