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Laura Pozzi
Laura Pozzi
Full Professor of Computer Science, USI Lugano, Switzerland
Verified email at usi.ch - Homepage
Title
Cited by
Cited by
Year
Automatic application-specific instruction-set extensions under microarchitectural constraints
K Atasu, L Pozzi, P Ienne
Proceedings of the 40th annual Design Automation Conference, 256-261, 2003
4572003
Exact and approximate algorithms for the extension of embedded processor instruction sets
L Pozzi, K Atasu, P Ienne
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2006
2592006
Seamless hardware-software integration in reconfigurable computing systems
M Vuletid, L Pozzi, P Ienne
IEEE Design & Test of Computers 22 (2), 102-113, 2005
1242005
EGRA: A coarse grained reconfigurable architectural template
G Ansaloni, P Bonzini, L Pozzi
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (6 …, 2010
1232010
Exploiting pipelining to relax register-file port constraints of instruction-set extensions
L Pozzi, P Ienne
Proceedings of the 2005 international conference on Compilers, architectures …, 2005
1092005
Automatic instruction set extension and utilization for embedded processors
A Peymandoust, L Pozzi, P Ienne, G De Micheli
Proceedings IEEE International Conference on Application-Specific Systems …, 2003
1062003
A DAG-based design approach for reconfigurable VLIW processors
C Alippi, W Fornaciari, L Pozzi, M Sami
Proceedings of the conference on Design, automation and test in Europe, 57-es, 1999
981999
Introduction of local memory elements in instruction set extensions
P Biswas, V Choudhary, K Atasu, L Pozzi, P Ienne, N Dutt
Proceedings of the 41st annual Design Automation Conference, 729-734, 2004
922004
Stream computations organized for reconfigurable execution
A DeHon, Y Markovsky, E Caspi, M Chu, R Huang, S Perissakis, L Pozzi, ...
Microprocessors and Microsystems 30 (6), 334-354, 2006
832006
Polynomial-time subgraph enumeration for automated instruction set extension
P Bonzini, L Pozzi
2007 Design, Automation & Test in Europe Conference & Exhibition, 1-6, 2007
812007
ISEGEN: Generation of high-quality instruction set extensions by iterative improvement
P Biswas, S Banerjee, N Dutt, L Pozzi, P Ienne
Design, Automation and Test in Europe, 1246-1251, 2005
722005
Automatic identification of application-specific functional units with architecturally visible storage
P Biswas, N Dutt, P Ienne, L Pozzi
Proceedings of the Design Automation & Test in Europe Conference 1, 1-6, 2006
60*2006
A simulation-based methodology for evaluating the DPA-resistance of cryptographic functional units with application to CMOS and MCML technologies
F Regazzoni, S Badel, T Eisenbarth, J Grobschadl, A Poschmann, ...
2007 International Conference on Embedded Computer Systems: Architectures …, 2007
582007
Approximate logic synthesis: A survey
I Scarabottolo, G Ansaloni, GA Constantinides, L Pozzi, S Reda
Proceedings of the IEEE 108 (12), 2195-2213, 2020
512020
Virtual memory window for application-specific reconfigurable coprocessors
M Vuletić, L Pozzi, P Ienne
Proceedings of the 41st annual Design Automation Conference, 948-953, 2004
482004
Performance and energy benefits of instruction set extensions in an FPGA soft core
P Biswas, S Banerjee, N Dutt, P Ienne, L Pozzi
19th International Conference on VLSI Design held jointly with 5th …, 2006
452006
Recurrence-aware instruction set selection for extensible embedded processors
P Bonzini, L Pozzi
IEEE transactions on very large scale integration (VLSI) systems 16 (10 …, 2008
442008
Code transformation strategies for extensible embedded processors
P Bonzini, L Pozzi
Proceedings of the 2006 international conference on Compilers, architecture …, 2006
402006
ISEGEN: An iterative improvement-based ISE generation technique for fast customization of processors
P Biswas, S Banerjee, ND Dutt, L Pozzi, P Ienne
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 14 (7), 754-762, 2006
402006
Circuit carving: A methodology for the design of approximate hardware
I Scarabottolo, G Ansaloni, L Pozzi
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 545-550, 2018
372018
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